DocumentCode :
277348
Title :
Steady-state response measurements
Author :
Suparjo, B.S. ; Wilkins, B.R.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fYear :
1992
fDate :
33739
Firstpage :
42401
Lastpage :
42404
Abstract :
An analogue fault analysis based on the steady state output voltage measurement is proposed. Results show that 100% detection of defects can be achieved by applying only a small number of input stimuli. This paper proposes a fault analysis method for analogue circuit modules at board level
Keywords :
analogue circuits; operational amplifiers; printed circuit testing; 100% fault detection; analogue circuit modules; analogue fault analysis; board level; op-amps; small number of input stimuli; steady state output voltage measurement;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Testing Mixed Signal Circuits, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
168380
Link To Document :
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