DocumentCode
277352
Title
Automatic generation of mixed-signal test programs from simulation data
Author
Diamant, P.E. ; Harrold, S.J.
Author_Institution
Dept. of Electr. Eng. & Electron., Univ. of Manchester, Inst. of Sci. & Technol., UK
fYear
1992
fDate
33739
Firstpage
42522
Lastpage
42525
Abstract
Links from digital simulators to automatic test equipment (ATE) are now an accepted, and in many cases indispensable part of the digital circuit designer´s armoury. However similar facilities for testing analogue and mixed-signal circuits are virtually unknown. This paper describes a test equipment independent method for automatically creating test programs from SPICE simulations of these circuits
Keywords
application specific integrated circuits; integrated circuit testing; ATE; ATPG; SPICE simulations; analogue circuit testing; automatic generation of test programs; automatic test equipment; automatically creating test programs; digital simulators; mixed-signal IC testing; mixed-signal test programs; simulation data; test equipment independent method;
fLanguage
English
Publisher
iet
Conference_Titel
Testing Mixed Signal Circuits, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
168384
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