The improvement of observation and characterization techniques applied to embedded analogue to digital convertors

Considering the ADC as a `Black Box´, the pulse must be adapted such that conventional testing can be used to characterize it. It is widely accepted that sinewaves can be used to test ADCs, however when the ADC is embedded problems occur when attempting to get the sinewave to the input of the ADC. This problem is heightened when there exists digital circuit blocks preceding the ADC input. To overcome this problem the waveshape should be changed and be generated on chip. Additional analysis suggests best waveshape to use is a triangular wave