DocumentCode
2774058
Title
New test access for high resolution ΣΔ ADCs by using the noise transfer function evaluation
Author
De Venuto, Daniela
Author_Institution
DEE Politecnico di Bari, Italy
fYear
2004
fDate
2004
Firstpage
81
Lastpage
85
Abstract
A new solution to improve the testability of high resolution ΣΔ analogue to digital converters (ΣΔ ADCs) using the quantizer input as a test node is described. Both the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.
Keywords
integrated circuit noise; integrated circuit testing; sigma-delta modulation; transfer functions; ADC test access; analogue to digital converters; audio ADC; high resolution SD ADC; noise transfer function; quantizer input test node; test response analysis computation overhead; testability; Additive noise; Delay; Delta modulation; Digital filters; Frequency; Noise figure; Noise shaping; Quantization; Testing; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on
Print_ISBN
0-7695-2093-6
Type
conf
DOI
10.1109/ISQED.2004.1283654
Filename
1283654
Link To Document