Title :
The IP quality revolution
Author :
Keating, Michael
Abstract :
The future of IP quality lies in IP developers and IP users working together in order to create environments and methodologies that will maximize IP reliability and performance, while reducing defects.
Keywords :
automatic test pattern generation; circuit CAD; design for quality; hardware-software codesign; integrated circuit design; system-on-chip; IP developers; IP performance; IP quality; IP reliability; IP users; SoC design; code reviews; constrained random test environment; customer expectations; design reviews; environments creation; future trends; hardware validation; quality by design; quality by verification; reducing defects; vendor-customer relationship; well-partitioned design; Automobile manufacture; Computer bugs; Consumer electronics; Electric breakdown; Fuels; Hardware; Humans; Ignition; Microcontrollers; Technological innovation;
Conference_Titel :
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on
Print_ISBN :
0-7695-2093-6
DOI :
10.1109/ISQED.2004.1283666
