DocumentCode
2774471
Title
Thermal management of heat spreader materials for flip chip type package
Author
Hirose, Yoshiyuki ; Yamagata, Shin-ichi ; Imamura, Makoto ; Abe, Yugaku ; Fukui, Akira ; Shimazu, Mitsuru ; Fujimori, Naoji
Author_Institution
Sumitomo Electr. Ind. Ltd., Hyogo, Japan
fYear
1999
fDate
9-11 March 1999
Firstpage
105
Lastpage
112
Abstract
The heat spreader for the organic package in a flip chip assembly was investigated. The thermal management analysis, which is based on thermal simulation techniques and an experimental database, was applied to find suitable materials for the heat spreader. We successfully accomplished the simulation technique for the thermal management, which is consistent with the experimental results. We revealed that the critical stress in the die attach resin should be less than 2 kgf/mm/sup 2/ through this technique. We also revealed that the CTE of the heat spreader material should range from 8 to 16 ppm/K. This value of CTE supports the proposal that sintered Al-SiC is suitable as a heat spreader material for an organic package with flip chip assembly. Furthermore, the adhesive strength of Al-SiC with the resin is strong enough to be used as the heat spreader material.
Keywords
adhesion; aluminium; circuit simulation; composite materials; flip-chip devices; heat sinks; integrated circuit bonding; integrated circuit modelling; integrated circuit packaging; microassembling; silicon compounds; sintering; stress analysis; thermal analysis; thermal expansion; thermal management (packaging); thermal stresses; Al-SiC; adhesive strength; critical stress; die attach resin; experimental database; flip chip assembly; flip chip type package; heat spreader; heat spreader material CTE; heat spreader materials; organic package; sintered Al-SiC heat spreader material; thermal management; thermal management analysis; thermal simulation techniques; Analytical models; Assembly; Databases; Flip chip; Microassembly; Organic materials; Packaging; Resins; Thermal management; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1999. Fifteenth Annual IEEE
Conference_Location
San Diego, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-5264-5
Type
conf
DOI
10.1109/STHERM.1999.762435
Filename
762435
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