• DocumentCode
    2774648
  • Title

    On the application of coloured Petri nets to computer aided assembly planning

  • Author

    Groppetti, Roberto ; Santucci, Antonio ; Senin, Nicola

  • Author_Institution
    Istituto di Energetica, Perugia Univ., Italy
  • fYear
    1994
  • fDate
    6-10 Nov. 1994
  • Firstpage
    381
  • Lastpage
    387
  • Abstract
    The problem of assembly process planning is particularly critical for the automation and integration of production, due to the combinatorial complexity and the requirement of both flexibility and productivity. Several planning methodologies and techniques have been proposed in the literature, using an approach limited to specific product typologies and structures. Some of them are more suitable for dedicated automated assembly and assembly lines than for flexible automated assembly and flexible assembly systems (FAS) and assembly job shops. Due to the time-based competition, both cycle time reduction and task parallelism increase require a technique suitable to the generation of assembly plans with flexibility, efficiency and parallelism. The paper presents and discusses the application of coloured Petri nets (CPN) and timed coloured Petri nets (TCPN) to the computer aided assembly planning (CAAP) problem, both to online and off-line planning, and presents a prototype CAAP architecture, that is implemented and validated by means of the assembly planning of an industrial product.<>
  • Keywords
    Petri nets; assembling; computer aided production planning; manufacturing data processing; production control; automation; computer aided assembly planning; cycle time reduction; flexible assembly systems; production control; task parallelism; timed coloured Petri nets; Application software; Assembly systems; Automation; Birth disorders; Parallel processing; Petri nets; Process planning; Production; Productivity; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 1994. ETFA '94., IEEE Symposium on
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    0-7803-2114-6
  • Type

    conf

  • DOI
    10.1109/ETFA.1994.401986
  • Filename
    401986