Title :
Evaluation of the disturbing potential of IEMI using mathematical norms and analytical calculations
Author :
Korte, Sven ; Garbe, Heyno
Author_Institution :
Inst. of the Basics of Electr. Eng. & Meas. Sci., Leibniz Univ. Hannover, Hannover
Abstract :
This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
Keywords :
circuit noise; electromagnetic interference; standards; IEMI; Intentional Electromagnetic Interference; coupled-in waveforms; disturbing potential; electromagnetic field; electronic circuits; mathematical norms; perturbation threshold estimation; Coupling circuits; Electric breakdown; Electromagnetic analysis; Electromagnetic fields; Electromagnetic measurements; Electronic circuits; Pulse measurements; Shape measurement; Transfer functions; Voltage; IEMI; breakdown; coupling; electronic; intentional; transient;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786915
