DocumentCode
2775343
Title
Modelling of optical breakdown in dielectrics including thermal effects relevant for nanosecond pulses and sequences of ultra-short laser pulses
Author
Liang, X. ; Linz, N. ; Noack, J. ; Vogel, A.
Author_Institution
Inst. of Biomed. Opt., Univ. of Luebeck, Luebeck, Germany
fYear
2009
fDate
14-19 June 2009
Firstpage
1
Lastpage
1
Abstract
The authors complemented the rate equation for the free-electron density rho by a term describing thermal ionization. Heating through collision losses and recombination of the free electrons produced by nonlinear absorption, and its counteraction by heat diffusion out of the focal volume are considered. For sufficiently high temperatures, the electron energy distribution reaches across the band gap into the conduction band, and we treat electrons with E > Egap as thermally ionized. The model performance on the example of breakdown in water is shown by an 8.8-ns, 532 nm pulse, with rhocr = 0.5 x 1021 cm-3, and tauc = 1.5 fs. Consideration of thermal ionization and calculation of the breakdown-induced temperature evolution creates a link between the energy deposition by nonlinear absorption and the resulting hydrodynamic phenomena that will greatly improve the understanding of plasma-mediated ablation.
Keywords
electric breakdown; laser ablation; laser beam effects; thermo-optical effects; water; H2O; collision losses; dielectrics; electron energy distribution; free electron recombination; heat diffusion; nanosecond pulses; nonlinear absorption; optical breakdown; plasma-mediated ablation; thermal effects; thermal ionization; time 1.5 fs; time 8.8 ns; wavelength 532 nm; Absorption; Dielectric breakdown; Electron optics; Free electron lasers; Ionization; Laser modes; Nonlinear equations; Nonlinear optics; Optical pulses; Plasma temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-4079-5
Electronic_ISBN
978-1-4244-4080-1
Type
conf
DOI
10.1109/CLEOE-EQEC.2009.5191546
Filename
5191546
Link To Document