DocumentCode

2775493

Title

Visual inspection automation

Author

Jarvis, John F.

Author_Institution

Bell Laboratories

fYear

1979

fDate

1979

Firstpage

251

Lastpage

255

Keywords

Assembly; Contacts; Costs; Hardware; Image analysis; Image processing; Image sensors; Inspection; Manufacturing automation; Pattern recognition;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Software and Applications Conference, 1979. Proceedings. COMPSAC 79. The IEEE Computer Society's Third International

Type

conf

DOI

10.1109/CMPSAC.1979.762499

Filename

762499