Title :
Data models for automatic inspection
Author_Institution :
General Electric Company
Keywords :
Data models; Hardware; Histograms; Image analysis; Image segmentation; Inspection; Least squares approximation; Pixel; Polynomials; Transmission line matrix methods;
Conference_Titel :
Computer Software and Applications Conference, 1979. Proceedings. COMPSAC 79. The IEEE Computer Society's Third International
DOI :
10.1109/CMPSAC.1979.762500
