• DocumentCode
    2775555
  • Title

    Ranking Ontologies Using Verified Entities to Facilitate Federated Queries

  • Author

    Alipanah, Neda ; Srivastava, Piyush ; Parveen, Pallabi ; Thuraisingham, Bhavani

  • Author_Institution
    Dept. of Comput. Sci., Univeristy of Texas at Dallas, Richardson, TX, USA
  • Volume
    1
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 3 2010
  • Firstpage
    332
  • Lastpage
    337
  • Abstract
    In view of the need for highly distributed and federated architecture, ranking ontologies from different data sources in a specific domain have great impact on the performance of web applications. Since ontologies for a same domain usually overlap, we aim to rank ontologies based on the commonality of overlapping entities and distance between each pair of ontologies. Overlapping entities are determined by considering entities and relationships between them in ontology´s graph. First we find out the Common Subset of Entities (CSE) between two ontologies using the lexical and structural similarity of entities. Second, we propose a novel strategy to find the similarity between ontologies by an Entropy Based Distribution (EBD) measurement. Third, we rank some synthetic and non-synthetic ontologies based on EBD values by naive and clustering approaches. Finally, we compare our approach with an existing approach and show effectiveness of our EBD approach. Ranking ontologies has great impact in different web scenarios including the federated query expansion and knowledge searching.
  • Keywords
    graph theory; information resources; ontologies (artificial intelligence); query processing; Web application; data source; entropy based distribution measurement; federated query expansion; knowledge searching; ontologies ranking; ontologys graph; synthetic ontology; Expansion Terms; Federated Query; Ontology; Ontology Matching; Query Expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Web Intelligence and Intelligent Agent Technology (WI-IAT), 2010 IEEE/WIC/ACM International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-8482-9
  • Electronic_ISBN
    978-0-7695-4191-4
  • Type

    conf

  • DOI
    10.1109/WI-IAT.2010.147
  • Filename
    5616593