Sensitivity analysis of the two-thickness and two-layer methods for material parameter extraction using a single waveguide probe

Author

Dester, Gary D. ; Rothwell, Edward J.

Author_Institution

Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI

fYear

2008

fDate

5-11 July 2008

Firstpage

1

Lastpage

4

Abstract

A full-wave solution for material parameter extraction which uses two independent measurements is presented. When the addition of random noise on the measurements is considered, the estimates of the propagation of those errors greatly reduces the confidence in the two-layer results. Future work shall investigate the two-layer method using different thicknesses and types of material for the top layer.

Keywords

magnetic field integral equations; magnetic materials; magnetic permeability measurement; permittivity; permittivity measurement; conductor-backed material; error analysis; magnetic field integral equation; material parameter extraction; open flange; open-ended waveguide probe; permittivity; random noise; root finding method; sensitivity analysis; single waveguide probe; two-layer methods; two-thickness methods; Conducting materials; Electromagnetic waveguides; Geometry; Magnetic field measurement; Magnetic materials; Parameter extraction; Probes; Reflection; Sensitivity analysis; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE

Conference_Location

San Diego, CA

Print_ISBN

978-1-4244-2041-4

Electronic_ISBN

978-1-4244-2042-1

Type

conf

DOI

10.1109/APS.2008.4619792

Filename

4619792