Title :
De-embedding of lumped-element characteristics with the aid of EM analysis
Author :
Hirano, T. ; Hirokawa, J. ; Ando, M. ; Nakano, H. ; Hirachi, Y.
Author_Institution :
Tokyo Inst. of Technol., Tokyo
Abstract :
We have proposed de-embedding method with the aid of EM analysis. A hybrid S/Z-parameters are used for a four-port parasitic circuit. The higher accuracy of the proposed method, within 4%, is validated via EM simulation than that of conventional method using open/short-TEG, more than 10%. Verification of the proposed method by experiment is the future task.
Keywords :
computational electromagnetics; EM analysis; TEG; four-port parasitic circuit; hybrid S-Z parameters; lumped-element characteristics; Admittance measurement; Circuit simulation; Circuit testing; FETs; Impedance; Integrated circuit interconnections; Integrated circuit technology; Parameter extraction; Scattering parameters; Uncertainty;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619795
