Abstract :
The following topics are dealt with: built-in self-test; automatic test generation; industrial experience; process control; process variation; fault modeling; fault simulation; HDL-based IC design; thermal-aware design; low-power design; mixed-signal test; radiation effects on ICs; software testing and design verification method.
Keywords :
automatic test pattern generation; built-in self test; design for testability; embedded systems; fault simulation; fault tolerance; hardware description languages; integrated circuit design; integrated circuit testing; low-power electronics; process control; program testing; program verification; radiation effects; HDL-based IC design; automatic test generation; built-in selftest; design verification method; fault modeling; fault simulation; industrial experience; low-power design; mixed-signal test; process control; process variation; radiation effects; software testing; thermal-aware design;
Conference_Titel :
Test Workshop (LATW), 2011 12th Latin American
Conference_Location :
Porto de Galinhas
Print_ISBN :
978-1-4577-1489-4
DOI :
10.1109/LATW.2011.5985886
