Title :
Evaluating coverage collection using the VEasy functional verification tool suite
Author :
Pagliarini, Samuel Nascimento ; Haacke, Paulo André ; Kastensmidt, Fernanda Lima
Author_Institution :
Programa de Pos-Grad. em Microeletronica, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
This paper describes a performance evaluation of coverage collection on different simulators. It also describes how coverage is collected using VEasy, a tool suite developed specifically for aiding the process of Functional Verification. A Verilog module is used as an example of where each coverage metric applies. The block and toggle coverage collection algorithms used in VEasy are presented and explained in detail. Finally, the results show that the algorithms used in VEasy are capable of performing coverage collection with a lower simulation overhead when compared with commercial simulators.
Keywords :
formal verification; hardware description languages; software performance evaluation; VEasy functional verification tool suite; Verilog module; block coverage collection algorithm; coverage collection performance evaluation; toggle coverage collection algorithm; Adders; Analytical models; Arrays; Automation; Hardware design languages; Integrated circuit modeling; Measurement; Functional verification; coverage analysis; coverage collection; dynamic verification; simulation;
Conference_Titel :
Test Workshop (LATW), 2011 12th Latin American
Conference_Location :
Porto de Galinhas
Print_ISBN :
978-1-4577-1489-4
DOI :
10.1109/LATW.2011.5985893