Title :
SETH: an expert system for functional test and fault diagnosis of electronic devices
Author :
Vavassori, R. ; Angeleri, V.
Abstract :
The authors describe how test benches based on the SETH System are used in Siemens Telecomunicazioni connected one another to form a testing line. During its activity SETH automatically drives the complex set of instruments that forms the test bench. By comparing the actual value read on the unit under test and the values stored in the knowledge base, SETH determines the next action to be executed. The knowledge base of SETH is fully maintainable by the testing experts without the help of the knowledge engineers
Conference_Titel :
Intelligent Systems Engineering, 1992., First International Conference on (Conf. Publ. No. 360)
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-549-4