• DocumentCode
    2776404
  • Title

    Mesh Quality Analysis of MRI Content-adaptive FE Head Models for Neuro-Electromagnetic Imaging

  • Author

    Lee, W.H. ; Kim, T.-S. ; Kim, Y.H. ; Lee, S.Y.

  • Author_Institution
    Dept. of Biomed. Eng., Kyung Hee Univ., Gyeonggi
  • fYear
    2007
  • fDate
    2-5 May 2007
  • Firstpage
    248
  • Lastpage
    251
  • Abstract
    Realistic finite element (FE) head models for neuro-electromagnetic imaging are getting more attention due to their analytic advantages over conventional models. To improve the numerical efficiency, we have previously developed a novel mesh generation scheme that produces FE head models automatically that are content-adaptive to given MR images. MRI content-adaptive FE meshes (cMeshes) represent the electrically conducting domain more effectively with less number of nodes and elements, thus lessen the computational loads. In general, the cMesh generation is affected by the selection of feature maps derived from MRI. In this study, we have tested the effects of various feature maps on the generation of cMesh FE head models. Also we have evaluated the quality of cMesh FE head models to check their suitability for neuro-electromagnetic imaging using EEG and MEG. The results suggest that the cMesh FE head models with properly selected feature maps do show acceptable quality to be used in neuro-electromagnetic imaging.
  • Keywords
    biomedical MRI; medical image processing; mesh generation; MRI content-adaptive finite element mesh; cMesh generation; content-adaptive finite element head model; encephalography; magnetic resonance imaging; magnetoencephalography; mesh quality analysis; neuro-electromagnetic imaging; realistic finite element head model; Anisotropic magnetoresistance; Brain modeling; Electroencephalography; Finite element methods; Head; Image analysis; Iron; Magnetic resonance imaging; Mesh generation; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Engineering, 2007. CNE '07. 3rd International IEEE/EMBS Conference on
  • Conference_Location
    Kohala Coast, HI
  • Print_ISBN
    1-4244-0792-3
  • Electronic_ISBN
    1-4244-0792-3
  • Type

    conf

  • DOI
    10.1109/CNE.2007.369658
  • Filename
    4227263