Title :
A cache based algorithm to predict HDL modules faults
Author :
Nacif, José Augusto M ; Silva, Thiago S F ; Vieira, Luiz Filipe M ; Vieira, Alex Borges ; Fernandes, Antônio O. ; Coelho, Claudionor N., Jr.
Author_Institution :
Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
Abstract :
Verification is the most challenging and time consuming stage in the integrated circuit development cycle. As designs complexities double every two years, novel verification methodologies are needed. We propose an algorithm that dynamically builds and updates an HDL module error proneness list. This list can be used to assist the development team to allocate resources during verification stage. The algorithm is build up using the idea that problematic modules usually hide many uncovered errors. Thus, our algorithm caches the most frequently modified and fixed modules. In an academic experiment composed by 17 modules, using a cache of size 3, we were able to correctly predict almost 80% of the faults occurrences.
Keywords :
electrical faults; hardware description languages; hardware-software codesign; integrated circuit design; HDL module error proneness list; HDL module faults; cache based algorithm; modern integrated circuits; Circuit faults; Hardware design languages; History; Integrated circuits; Prediction algorithms; Software; Software engineering;
Conference_Titel :
Test Workshop (LATW), 2011 12th Latin American
Conference_Location :
Porto de Galinhas
Print_ISBN :
978-1-4577-1489-4
DOI :
10.1109/LATW.2011.5985931