Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity

Author

Benfica, Juliano ; Poehls, Letícia Bolzani ; Vargas, Fabian ; Lipovetzky, José ; Lutenberg, Ariel ; García, Sebastián E. ; Gatti, Edmundo ; Hernandez, Fernando ; Calazans, Ney L V

Author_Institution

Electr. Eng. Dept., Catholic Univ. - PUCRS, Porto Alegre, Brazil

fYear

2011

fDate

27-30 March 2011

Firstpage

1

Lastpage

6

Abstract

The roadmap for standardization of electromagnetic (EM) immunity measurement methods has reached a high degree of success with the IEC 62.132 proposal. The same understanding can be taken from the MIL-STD-883H for total ionizing dose (TID) radiation. However, no effort has been performed to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For secure embedded systems and systems-on-chip (SoC) devoted to critical applications, these combined-effect measurements are mandatory. In this paper, we present a configurable platform devoted for combined tests of EM immunity and TID radiation measurements of prototype embedded systems. The platform attends the IEC 62.132-2 (for radiated EM noise), IEC 61.0004-17 and IEC 61.0004-29 (for conducted EM disturbance) and 1019.8 method for TID Test Procedure of MIL-STD-883H.

Keywords

IEC standards; embedded systems; integrated circuit testing; radiation effects; EM immunity measurement method; EM noise; IC combined test; IEC 1019.8 standard; IEC 61.0004-17 standard; IEC 61.0004-29 standard; IEC 62.132 standard; IEC 62.132-2 standard; SoC; TID radiation measurement; combined-effect measurement; configurable platform; electromagnetic immunity measurement method; secure embedded system; systems-on-chip; total-ionizing dose radiation measurement; Connectors; Field programmable gate arrays; IEC standards; Noise; Optical fiber amplifiers; Optical fiber cables; Voltage control; Electromagnetic interference; Pre-certification testing platform; Safety system-on-chip; Total-ionizing dose radiation;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop (LATW), 2011 12th Latin American

Conference_Location

Porto de Galinhas

Print_ISBN

978-1-4577-1489-4

Type

conf

DOI

10.1109/LATW.2011.5985935

Filename

5985935