DocumentCode :
2777227
Title :
Identifying The Source Of Dust Produced During LSI Fabrication
Author :
Takeuchi, Hideaki
Author_Institution :
NTT LSI Laboratories
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
116
Lastpage :
118
Keywords :
Character generation; Fabrication; Instruments; Laboratories; Large scale integration; Layout; Monitoring; Production; Shape; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
Type :
conf
DOI :
10.1109/IEMT.1992.639873
Filename :
639873
Link To Document :
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