Title :
The on-resistance limits of high cell density power MOSFET´s
Author :
Morancho, F. ; Tranduc, H. ; Rossel, P.
Author_Institution :
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
Abstract :
In this paper, the on-resistance limits of low-voltage power VDMOSFET´s and trench power MOSFET´s are studied, based on an analytical approach and 2D device modelling. It is shown that, unlike VDMOSFET, the trench MOSFET performance is not limited by the “JFET effect”. From a theoretical point of view, for N-channel devices, the 60 V optimized trench MOSFET would present a specific on-resistance equal to 0.32 mΩ.cm2 while the equivalent VDMOSFET would present a specific on-resistance of 0.51 mΩ.cm2
Keywords :
electric resistance; power MOSFET; semiconductor device models; 2D device modelling; 5 to 100 V; 60 V; JFET effect; N-channel devices; analytical approach; high cell density power MOSFET; low-voltage power VDMOSFET; on-resistance limits; trench power MOSFET; Application software; Automotive electronics; Cells (biology); Low voltage; MOSFETs; Neodymium; Power electronics; Power supplies; Steady-state; Threshold voltage;
Conference_Titel :
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-3664-X
DOI :
10.1109/ICMEL.1997.625277