DocumentCode :
2777453
Title :
Principle And Method Of Dynamic Parameters Measurement For Semiconductor Rectification Devices
Author :
Fu, Zhao ; Shuxin, Ge ; Zemin, Li ; Jinghua, Wang
Author_Institution :
Shijiazhuang Res. Inst. of Automation
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
119
Lastpage :
123
Keywords :
Automation; Capacitance; Equations; IEC standards; Power supplies; Qualifications; Semiconductor device testing; Semiconductor diodes; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
Type :
conf
DOI :
10.1109/IEMT.1992.639874
Filename :
639874
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2777453
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