DocumentCode

2777453

Title

Principle And Method Of Dynamic Parameters Measurement For Semiconductor Rectification Devices

Author

Fu, Zhao ; Shuxin, Ge ; Zemin, Li ; Jinghua, Wang

Author_Institution

Shijiazhuang Res. Inst. of Automation

fYear

1992

fDate

28-30 Sep 1992

Firstpage

119

Lastpage

123

Keywords

Automation; Capacitance; Equations; IEC standards; Power supplies; Qualifications; Semiconductor device testing; Semiconductor diodes; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International

Print_ISBN

0-7803-0755-0

Type

conf

DOI

10.1109/IEMT.1992.639874

Filename

639874