DocumentCode :
2777858
Title :
Evaluation of Interface Crack between Solder Ball and Copper Based on the Non-Destructive Monitoring of Direct Current Potential Difference
Author :
Tada, Naoya ; Andou, Takahiro
Author_Institution :
Okayama Univ., Okayama
fYear :
2006
fDate :
11-14 Dec. 2006
Firstpage :
1
Lastpage :
7
Abstract :
An evaluation method of interface crack between solder ball and copper based on the non-destructive monitoring of direct current potential difference was proposed. The validity of the method was examined based on the results of electric field analysis by the finite element method. In the analysis, it was assumed that a solder ball was simply joined on the surface of a copper plate and the interface crack was evaluated by the potential difference between the top of the wire inserted into the solder ball and the copper plate. It was found from the analysis that the relationship between the crack area ratio and the increase in the potential difference was given by a single formula for all the conditions assumed in this study. As an experimental verification, a cyclic tensile test was carried out for the interface between Sn-3Ag-0.5Cu lead-free solder balls and a plate specimen of pure copper. Similar relationship between the crack area ratio and the increase in the potential difference held for the test. This suggests that the proposed method is applicable to the evaluation of actual interface cracks initiated in the specimens or in various electric packages.
Keywords :
copper compounds; crack detection; electric fields; finite element analysis; nondestructive testing; reliability; silver compounds; solders; tensile testing; tin compounds; SnAgCu; copper plate; cyclic tensile testing; direct current potential difference; electric field analysis; electric packages; finite element method; interface crack evaluation; nondestructive monitoring; reliability testing; solder ball; Copper; Electronic waste; Environmentally friendly manufacturing techniques; Finite element methods; Inorganic materials; Lead; Monitoring; Temperature; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
Type :
conf
DOI :
10.1109/EMAP.2006.4430649
Filename :
4430649
Link To Document :
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