Test Yield Improvement of Class II Bluetooth Devices Through Power Output Optimization Via Circuit Element Tuning

To guarantee that products meet acceptance test specifications, final test is performed at the end of the assembly process. This is done to screen-out units that are possible defects before they are being delivered to the customer. Bluetooth devices also undergo final test using parameters that are defined by the Bluetooth specifications. One of the parameters in the final test is P_2480 (output power at channel 78 with a frequency of 2480 MHz), which ensures that the output power level of the device is within the limits that are defined by the customer. This study was conducted for the reason that power rejects most specifically on channel 78, are becoming primary in the major factors that contribute in low-test yield. Improving the product´s output power performance through evaluations and tuning of elements that make up the circuit, will reduce if not eliminate low power rejects on channel 78 (2480 MHz), and therefore increase the final test yield.