Title :
Trend Analysis of the CVE for Software Vulnerability Management
Author :
Chang, Yung-Yu ; Zavarsky, Pavol ; Ruhl, Ron ; Lindskog, Dale
Author_Institution :
Inf. Syst. Security Manage., Concordia Univ. Coll. of Alberta, Edmonton, AB, Canada
Abstract :
Understanding vulnerability trends is a key component of the risk management process. The focus of this research is to analyze the trends of Common Vulnerabilities and Exposures (CVE) from the National Vulnerability Database (NVD) from 2007 to 2010. We extracted 22,521 CVEs through the four years, also collected their Common Vulnerability Scoring System (CVSS) scores from the NVD, then we analyzed the overall frequency, severity, and CVSS base metrics trends. Our finding shows that the frequency of all vulnerabilities decreased by 28% from 2007 to 2010; also, the percentage of high severity incidents decreased for that period. Over 80% of the total vulnerabilities were exploitable by network access without authentication. We further studied the trends of the select fifteen (15) vulnerability types which contain 18,427 vulnerabilities by analyzing their changes in frequency, severity, and CVSS base metrics. This research findings can help information security professionals focus their efforts in preventing and mitigating the impact of the attacks, and influence the development of security strategies developed by IS professionals as well.
Keywords :
risk management; security of data; software reliability; CVE; CVSS base metrics; IS professionals; NVD; authentication; common vulnerability and exposure; common vulnerability scoring system; information security; national vulnerability database; network access; risk management process; software vulnerability management; trend analysis; Authentication; Complexity theory; Databases; Forgery; Measurement; Software; CVE; CVSS version2; NVD; vulnerability trend; vulnerability type;
Conference_Titel :
Privacy, Security, Risk and Trust (PASSAT) and 2011 IEEE Third Inernational Conference on Social Computing (SocialCom), 2011 IEEE Third International Conference on
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4577-1931-8
DOI :
10.1109/PASSAT/SocialCom.2011.184