• DocumentCode
    2778199
  • Title

    Logical circuit gate sizing using PSO guided by Logical Effort — An examination of the 4-stage half adder circuit

  • Author

    Johari, A. ; Mohamed, S. ; Halim, A.K. ; Yassin, I.M. ; Hassan, H.A.

  • Author_Institution
    Fac. of Electr. Eng., Univ. Teknol. Mara, Shah Alam, Malaysia
  • fYear
    2010
  • fDate
    5-8 Dec. 2010
  • Firstpage
    391
  • Lastpage
    395
  • Abstract
    Automated Complementary Metal Oxide Semiconductor (CMOS) logic circuit design leads to the reduction in costs associated with manpower and manufacturing time. Conventional methods use repetitive manual testing guided by Logical Effort (LE). LE provides an easy way to compare and select circuit topologies, choose the best number of stages for path and estimate path delay. In this paper, we propose the Particle Swarm Optimization (PSO) algorithm as a method to automate the process of CMOS circuit design by approaching the design process as an optimization problem. In our work, we choose gate widths inside the circuit as parameters to be optimized in order to achieve the target delay, and its fitness is guided by the LE method. Various parameters, such as swarm size and iterations were tested under different initialization conditions to verify PSO´s performance on a 4-stage half-adder circuit. Results have indicated that the PSO algorithm was an effective method to apply to the circuit design problem, with high convergence rates observed.
  • Keywords
    CMOS logic circuits; logic circuits; logic design; particle swarm optimisation; CMOS logic circuit design; PSO; half adder circuit; logical circuit gate sizing; logical effort; particle swarm optimization algorithm; Adders; Capacitance; Delay; Logic gates; Optimization; Particle swarm optimization; Transistors; Automated circuit design; Logical Effort; Particle swarm optimization; half-adder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Applications and Industrial Electronics (ICCAIE), 2010 International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-9054-7
  • Type

    conf

  • DOI
    10.1109/ICCAIE.2010.5735110
  • Filename
    5735110