DocumentCode :
277836
Title :
Improved fabrication technologies for GaAs power MMICs
Author :
Jessup, M. ; Davies, I. ; Bestwick, P.R. ; Vanner, K.C.
Author_Institution :
Plessey Res. Caswell Ltd., Towcester, UK
fYear :
1991
fDate :
33253
Firstpage :
42430
Lastpage :
42433
Abstract :
Describes the technology enhancements necessary to produce GaAs IC chips that combine small signal and power functions on a single chip. The well established small signal production MMIC process has a final substrate thickness of 200 μm and the active layers are prepared by ion implantation into semi-insulating GaAs substrates, both these aspects must be retained when fabricating power MMICs in order to maintain a high yield commercially compatible process. The realisation of power MMIC structures under these two main constraints has required the development of a new material doping specification and a novel heatsink structure
Keywords :
III-V semiconductors; MMIC; gallium arsenide; integrated circuit technology; ion implantation; power integrated circuits; 200 micron; GaAs; active layers; fabrication technologies; heatsink structure; ion implantation; material doping specification; power MMICs; power functions; semi-insulating substrates; small signal production; technology enhancements; yield;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Integrated Power Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
180812
Link To Document :
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