DocumentCode
2778455
Title
Design of a More Robust QFN Package through Virtual Prototyping and Advanced Characterization
Author
Hunat, Christopher ; Lagdameo, Creed ; Galang, Rodel ; Benedicto, Ela Mia
Author_Institution
NXP Semicond., Calamba
fYear
2006
fDate
11-14 Dec. 2006
Firstpage
1
Lastpage
4
Abstract
A new leadframe design is proposed as a solution to eliminate package cracking in a HVQFN (heatsink very thin quad flat no lead) package. The impact of the new design was first analyzed using finite element modeling (FEM) particularly the interfacial stresses brought about by coefficient of thermal expansion (CTE) mismatches between materials. Result was further verified experimentally using thermo mechanical analyzer (TMA) and actual engineering evaluation. TMA was used to determine and compare the delamination and cracking temperature between the standard HVQFN leadframe design and the new design. With the modification of the leadframe design, package cracking was eliminated. Package was able to pass MSL 1 (Pb-free condition) from a level 3 classification without changing the current assembly material set. It has even withstood the extended JEDEC standard number of thermal cycle test.
Keywords
cracks; delamination; electronics packaging; finite element analysis; heat sinks; interface phenomena; plastics; stress analysis; thermal expansion; virtual prototyping; FEM; QFN package; actual engineering evaluation; coefficient of thermal expansion; cracking temperature; delamination; finite element modeling; heatsink very thin quad flat no lead package; interfacial stresses; leadframe design; package cracking elimination; thermal cycle test; thermo mechanical analyzer; virtual prototyping; Assembly; Delamination; Finite element methods; Packaging; Robustness; Temperature; Testing; Thermal expansion; Thermal stresses; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location
Kowloon
Print_ISBN
978-1-4244-0834-4
Electronic_ISBN
978-1-4244-0834-4
Type
conf
DOI
10.1109/EMAP.2006.4430686
Filename
4430686
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