• DocumentCode
    2778455
  • Title

    Design of a More Robust QFN Package through Virtual Prototyping and Advanced Characterization

  • Author

    Hunat, Christopher ; Lagdameo, Creed ; Galang, Rodel ; Benedicto, Ela Mia

  • Author_Institution
    NXP Semicond., Calamba
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new leadframe design is proposed as a solution to eliminate package cracking in a HVQFN (heatsink very thin quad flat no lead) package. The impact of the new design was first analyzed using finite element modeling (FEM) particularly the interfacial stresses brought about by coefficient of thermal expansion (CTE) mismatches between materials. Result was further verified experimentally using thermo mechanical analyzer (TMA) and actual engineering evaluation. TMA was used to determine and compare the delamination and cracking temperature between the standard HVQFN leadframe design and the new design. With the modification of the leadframe design, package cracking was eliminated. Package was able to pass MSL 1 (Pb-free condition) from a level 3 classification without changing the current assembly material set. It has even withstood the extended JEDEC standard number of thermal cycle test.
  • Keywords
    cracks; delamination; electronics packaging; finite element analysis; heat sinks; interface phenomena; plastics; stress analysis; thermal expansion; virtual prototyping; FEM; QFN package; actual engineering evaluation; coefficient of thermal expansion; cracking temperature; delamination; finite element modeling; heatsink very thin quad flat no lead package; interfacial stresses; leadframe design; package cracking elimination; thermal cycle test; thermo mechanical analyzer; virtual prototyping; Assembly; Delamination; Finite element methods; Packaging; Robustness; Temperature; Testing; Thermal expansion; Thermal stresses; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430686
  • Filename
    4430686