DocumentCode :
2778521
Title :
New Nano-Thermal Interface Materials (Nano-TIMs) with SiC Nano-Particles Used for Heat Removal in Electronics Packaging Applications
Author :
Wang, Wen Xuan ; Lu, Xiuzhen ; Liu, Johan ; Olorunyomi, Michael Olugbenga ; Aronsson, Tomas ; Shangguan, Dongkai
Author_Institution :
Shanghai Univ., Shanghai
fYear :
2006
fDate :
11-14 Dec. 2006
Firstpage :
1
Lastpage :
5
Abstract :
Heat dissipation of semiconductor packages has become one of the limiting factors in miniaturization. A new Nano Thermal Interface Material (Nano-TIM) with potential high thermal conductivity and excellent mechanical properties manufactured by electrospinning process has been published earlier. In the present work, SiC nano-particles were added into the electrospinning solution to improve the thermal conductivity of the film. The produced Nano-TIM has a nano scale structure with embedded nano-SiC distributed randomly. Scanning Electrical Microscope (SEM) was used to determine the morphology of the film. Thermal properties were measured. The results show that the Nano-TIM has good thermal properties and it can be further improved by changing the mass concentration of the SiC nano particles.
Keywords :
electronics packaging; nanoparticles; scanning electron microscopy; silicon compounds; thermal properties; SiC; electronics packaging; electrospinning solution; embedded nanoSiC; heat removal; mass concentration; nanoparticles; nanothermal interface materials; scanning electrical microscope; thermal conductivity; thermal properties; Conducting materials; Electronic packaging thermal management; Electronics packaging; Mechanical factors; Nanostructured materials; Scanning electron microscopy; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
Type :
conf
DOI :
10.1109/EMAP.2006.4430688
Filename :
4430688
Link To Document :
بازگشت