DocumentCode :
2778629
Title :
Effective Acquisitions of Plastic, Creep, Viscoplastic Parameters of Solder Using the Stress Relaxation Method
Author :
Tanimura, Toshinobu ; Yu, Qiang ; Sibutani, Tadahiro ; Jin, Jae-Chul ; Shiratori, Masaki
Author_Institution :
Komatsu Ltd., Hiratsuka
fYear :
2006
fDate :
11-14 Dec. 2006
Firstpage :
1
Lastpage :
9
Abstract :
In electronic equipment, the estimated lifetime of a solder joint is being intensively investigated. For the assessment of thermal fatigue reliability, the mechanical properties of solder joints with regard to inelastic characteristics at a range of temperatures must be known. However, measuring solder´s material properties is costly and time-consuming. Thus, a quick and simple technique should be established immediately. In this paper, a tensile test with a stress relaxation method is proposed in order to obtain parameters such as the creep constant and index, and also the viscoplastic parameters defined by L. Anand et al. We discuss acquiring solder parameters by the conventional method (tensile testing), and an effective method using stress relaxation, which reduces the number of necessary tests. Then, we compare our experimental results and FEM analysis results, and the effectiveness of the proposed technique is confirmed. We use a thermoelectric module as an example.
Keywords :
fatigue testing; materials testing; solders; stress relaxation; viscoplasticity; FEM analysis; creep parameter acquisition; electronic equipment; fatigue reliability; solder joint; solder material property measurement; stress relaxation method; tensile testing; thermoelectric module; viscoplastic parameter acquisition; viscoplastic parameters; Creep; Electronic equipment; Life estimation; Lifetime estimation; Plastics; Relaxation methods; Soldering; Tensile stress; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
Type :
conf
DOI :
10.1109/EMAP.2006.4430696
Filename :
4430696
Link To Document :
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