• DocumentCode
    2778629
  • Title

    Effective Acquisitions of Plastic, Creep, Viscoplastic Parameters of Solder Using the Stress Relaxation Method

  • Author

    Tanimura, Toshinobu ; Yu, Qiang ; Sibutani, Tadahiro ; Jin, Jae-Chul ; Shiratori, Masaki

  • Author_Institution
    Komatsu Ltd., Hiratsuka
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    In electronic equipment, the estimated lifetime of a solder joint is being intensively investigated. For the assessment of thermal fatigue reliability, the mechanical properties of solder joints with regard to inelastic characteristics at a range of temperatures must be known. However, measuring solder´s material properties is costly and time-consuming. Thus, a quick and simple technique should be established immediately. In this paper, a tensile test with a stress relaxation method is proposed in order to obtain parameters such as the creep constant and index, and also the viscoplastic parameters defined by L. Anand et al. We discuss acquiring solder parameters by the conventional method (tensile testing), and an effective method using stress relaxation, which reduces the number of necessary tests. Then, we compare our experimental results and FEM analysis results, and the effectiveness of the proposed technique is confirmed. We use a thermoelectric module as an example.
  • Keywords
    fatigue testing; materials testing; solders; stress relaxation; viscoplasticity; FEM analysis; creep parameter acquisition; electronic equipment; fatigue reliability; solder joint; solder material property measurement; stress relaxation method; tensile testing; thermoelectric module; viscoplastic parameter acquisition; viscoplastic parameters; Creep; Electronic equipment; Life estimation; Lifetime estimation; Plastics; Relaxation methods; Soldering; Tensile stress; Testing; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430696
  • Filename
    4430696