• DocumentCode
    2778813
  • Title

    SiC junction FETs - a state of the art review

  • Author

    Mihaila, A.P. ; Udrea, F. ; Rashid, S.J. ; Godignon, P. ; Millan, J.

  • Author_Institution
    Dept. of Eng., Cambridge Univ.
  • Volume
    2
  • fYear
    2005
  • fDate
    5-5 Oct. 2005
  • Firstpage
    349
  • Lastpage
    352
  • Abstract
    The continuous progress made over the past years in terms of material quality and key technological issues have enabled silicon carbide (SiC) to mature as a material for high power semiconductor industry. These improvements combined with a better understanding of the physics of the devices have placed SiC devices in a position from where they can challenge the present day Silicon (Si) solutions in high power/high temperature applications. Amongst the multitude of SiC switches that have been demonstrated, the Junction Field Effect Transistor (JFET) is the most advanced on and, in fact, already available on the market. This paper reviews the present status of SiC junction-controlled devices and discusses the different approaches one may decide on when considering SiC JFETs for high power, high temperature applications
  • Keywords
    high-temperature electronics; junction gate field effect transistors; power semiconductor switches; silicon compounds; wide band gap semiconductors; JFETs; SiC; high power semiconductor industry; high power-high temperature applications; junction-controlled devices; silicon carbide junction field effect transistors; silicon carbide switches; Doping; FETs; Hybrid electric vehicles; JFET circuits; MOSFETs; Multichip modules; Silicon carbide; Switched-mode power supply; Switches; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-9214-0
  • Type

    conf

  • DOI
    10.1109/SMICND.2005.1558797
  • Filename
    1558797