Abstract :
The numerical method presented herein attempts to equate the scatterer under test to a prescribed equivalent scatterer by adjusting some geometrical and/or constitutive parameters of the equivalent scatterer to reproduce the given values of plane-wave scattering coefficients of the scatterer under test as a function of the incidence angle. Hence, the equivalence is based on the assumption that two different scatterers could have exactly the same curves of plane-wave scattering coefficients as a function of the incidence angle. However, this is not generally the case because to be able to adjust independently all eight variables of the plane-wave scattering coefficients, namely the four magnitudes |RTM|, |RTE|, |TTM|, |TTE|, and the four phases angRTM, angRTE, angTTM, angTTE, would require at least eight degrees of freedom for each desired value of the incidence angle. In this paper, the equivalent scatterer is a uniform homogeneous isotropic slab, and the two degrees of freedom are the relative permittivity epsiv´r and the conductivity sigma. Hence, it is not always possible to make the values of plane-wave scattering coefficients for the uniform homogeneous isotropic slab be exactly equal to the given values of plane-wave scattering coefficient as a function of the incidence angle by adjusting only the values of epsiv´r and sigma.
Keywords :
electromagnetic wave scattering; finite difference time-domain analysis; permittivity; FDTD method; conductivity; corrugated uniform homogeneous isotropic slab; equivalent scatterer; finite difference time-domain method; inverse scattering; oblique incidence; plane-wave scattering coefficient; relative permittivity; Conductivity; Dielectric materials; Finite difference methods; Inverse problems; Maxwell equations; Permittivity; Scattering parameters; Slabs; Testing; Time domain analysis;