• DocumentCode
    27792
  • Title

    Controlling Ambipolar Current in Tunneling FETs Using Overlapping Gate-on-Drain

  • Author

    Abdi, Dawit ; Kumar, M.J.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Delhi, New Delhi, India
  • Volume
    2
  • Issue
    6
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    In this paper, we have demonstrated that overlapping the gate on the drain can suppress the ambipolar conduction, which is an inherent property of a tunnel field effect transistor (TFET). Unlike in the conventional TFET where the gate controls the tunneling barrier width at both source-channel and channel-drain interfaces for different polarity of gate voltage, overlapping the gate on the drain limits the gate to control only the tunneling barrier width at the source-channel interface irrespective of the polarity of the gate voltage. As a result, the proposed overlapping gate-on-drain TFET exhibits suppressed ambipolar conduction even when the drain doping is as high as 1 × 1019 cm-3.
  • Keywords
    field effect transistors; tunnel transistors; TFET; ambipolar conduction suppression; ambipolar current control; channel-drain interfaces; drain doping; gate controls; gate voltage polarity; overlapping gate-on-drain; source-channel interfaces; tunnel field effect transistor; tunneling barrier width; Capacitance; Doping; Field effect transistors; Semiconductor process modeling; Tunneling; Ambipolarity; TFET; overlap length; overlapping gate-on-drain; tunneling barrier width;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2014.2327626
  • Filename
    6823663