DocumentCode
2779218
Title
SPICE simulations and circuit tests of digital noise reduction with MEMS inductors
Author
Dima, M.O. ; Becks, K.-H.
Author_Institution
Dept. of Phys., Wuppertal Univ.
Volume
2
fYear
2005
fDate
5-5 Oct. 2005
Firstpage
443
Abstract
Digital-noise reduction with decoupling capacitors in ever faster lower voltage technologies is gradually rendered ineffective by the line resistance to the capacitors. In contrast, blocking inductors show excellent noise reduction in SPICE simulations, the LdI/dt self-perturbance being solved with local auxiliary capacitors. The needed values for both inductances and capacitances are small, allowing their implementation in MCM (multi-chip module), or alternative, technologies. Circuit tests confirm the SPICE simulations
Keywords
SPICE; capacitors; circuit noise; circuit simulation; circuit testing; inductors; micromechanical devices; MEMS inductors; SPICE simulations; auxiliary capacitors; blocking inductors; circuit tests; decoupling capacitors; digital noise reduction; multichip module; noise reduction; voltage technologies; Capacitors; Circuit noise; Circuit simulation; Circuit testing; Inductors; Microelectronics; Micromechanical devices; Noise reduction; SPICE; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
Conference_Location
Sinaia
Print_ISBN
0-7803-9214-0
Type
conf
DOI
10.1109/SMICND.2005.1558822
Filename
1558822
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