• DocumentCode
    2779218
  • Title

    SPICE simulations and circuit tests of digital noise reduction with MEMS inductors

  • Author

    Dima, M.O. ; Becks, K.-H.

  • Author_Institution
    Dept. of Phys., Wuppertal Univ.
  • Volume
    2
  • fYear
    2005
  • fDate
    5-5 Oct. 2005
  • Firstpage
    443
  • Abstract
    Digital-noise reduction with decoupling capacitors in ever faster lower voltage technologies is gradually rendered ineffective by the line resistance to the capacitors. In contrast, blocking inductors show excellent noise reduction in SPICE simulations, the LdI/dt self-perturbance being solved with local auxiliary capacitors. The needed values for both inductances and capacitances are small, allowing their implementation in MCM (multi-chip module), or alternative, technologies. Circuit tests confirm the SPICE simulations
  • Keywords
    SPICE; capacitors; circuit noise; circuit simulation; circuit testing; inductors; micromechanical devices; MEMS inductors; SPICE simulations; auxiliary capacitors; blocking inductors; circuit tests; decoupling capacitors; digital noise reduction; multichip module; noise reduction; voltage technologies; Capacitors; Circuit noise; Circuit simulation; Circuit testing; Inductors; Microelectronics; Micromechanical devices; Noise reduction; SPICE; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-9214-0
  • Type

    conf

  • DOI
    10.1109/SMICND.2005.1558822
  • Filename
    1558822