DocumentCode :
2779218
Title :
SPICE simulations and circuit tests of digital noise reduction with MEMS inductors
Author :
Dima, M.O. ; Becks, K.-H.
Author_Institution :
Dept. of Phys., Wuppertal Univ.
Volume :
2
fYear :
2005
fDate :
5-5 Oct. 2005
Firstpage :
443
Abstract :
Digital-noise reduction with decoupling capacitors in ever faster lower voltage technologies is gradually rendered ineffective by the line resistance to the capacitors. In contrast, blocking inductors show excellent noise reduction in SPICE simulations, the LdI/dt self-perturbance being solved with local auxiliary capacitors. The needed values for both inductances and capacitances are small, allowing their implementation in MCM (multi-chip module), or alternative, technologies. Circuit tests confirm the SPICE simulations
Keywords :
SPICE; capacitors; circuit noise; circuit simulation; circuit testing; inductors; micromechanical devices; MEMS inductors; SPICE simulations; auxiliary capacitors; blocking inductors; circuit tests; decoupling capacitors; digital noise reduction; multichip module; noise reduction; voltage technologies; Capacitors; Circuit noise; Circuit simulation; Circuit testing; Inductors; Microelectronics; Micromechanical devices; Noise reduction; SPICE; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-9214-0
Type :
conf
DOI :
10.1109/SMICND.2005.1558822
Filename :
1558822
Link To Document :
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