Title :
IEE Colloquium on `Design Management Environments in CAD´ (Digest No.024)
Abstract :
The following topics were dealt with: flexible design methodology management; VLSI testing with CAD; EMI management using CAD system; integrated industrial product development with CAD; project risk analysis in CAD; and silicon systems design
Keywords :
CAD; VLSI; design engineering; electromagnetic interference; electronic engineering computing; CAD system; EMI management; VLSI testing; flexible design methodology management; integrated industrial product development; project risk analysis; silicon systems design;
Conference_Titel :
Design Management Environments in CAD, IEE Colloquium on
Conference_Location :
London
