• DocumentCode
    277941
  • Title

    IEE Colloquium on `Design Management Environments in CAD´ (Digest No.024)

  • fYear
    1991
  • fDate
    33269
  • Abstract
    The following topics were dealt with: flexible design methodology management; VLSI testing with CAD; EMI management using CAD system; integrated industrial product development with CAD; project risk analysis in CAD; and silicon systems design
  • Keywords
    CAD; VLSI; design engineering; electromagnetic interference; electronic engineering computing; CAD system; EMI management; VLSI testing; flexible design methodology management; integrated industrial product development; project risk analysis; silicon systems design;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Design Management Environments in CAD, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    180955