• DocumentCode
    2779413
  • Title

    Investigation of reverse current for crystalline silicon solar cells—New concept for a test standard about the reverse current

  • Author

    Yang, Hong ; Xu, Wenwu ; Wang, He ; Narayanan, Mohan

  • Author_Institution
    Dept. of Phys., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    The effect of reverse current on reliability of crystalline silicon solar modules was investigated. Based on the experiments, the relation between reverse current and hot-spot protection was discussed. In avoid of the formation of hot spots, the reverse current should be smaller than 1.5 A for 125mm×125mm mono-crystalline silicon solar cells when the bias voltage is at -12V.
  • Keywords
    elemental semiconductors; reliability; silicon; solar cells; Si; hot-spot protection; mono-crystalline silicon solar cells; reliability; reverse current; voltage -12 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616787
  • Filename
    5616787