Title :
Investigation of reverse current for crystalline silicon solar cells—New concept for a test standard about the reverse current
Author :
Yang, Hong ; Xu, Wenwu ; Wang, He ; Narayanan, Mohan
Author_Institution :
Dept. of Phys., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
The effect of reverse current on reliability of crystalline silicon solar modules was investigated. Based on the experiments, the relation between reverse current and hot-spot protection was discussed. In avoid of the formation of hot spots, the reverse current should be smaller than 1.5 A for 125mm×125mm mono-crystalline silicon solar cells when the bias voltage is at -12V.
Keywords :
elemental semiconductors; reliability; silicon; solar cells; Si; hot-spot protection; mono-crystalline silicon solar cells; reliability; reverse current; voltage -12 V;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5616787