• DocumentCode
    2779438
  • Title

    Measurement on the modulation depth of moire and spot size [CRT display]

  • Author

    Liang, Cho-Liang

  • Author_Institution
    CRT R&D Div., TECO Inf. Syst. Co. Ltd., Taoyuan, Taiwan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    261
  • Lastpage
    264
  • Abstract
    It is known that moire is the counterpart of readability/focus performance. Nowadays, the requirement on the readability of a CDT is getting higher and forces the gun designers to make the beam spot smaller and smaller. This makes moire inevitable under certain application conditions, because the visibility of the moire pattern is determined by the electron beam spot, while the structure of mask aperture determines moire wavelength. This paper is devoted to the study of the relationship between the visibility of scan moire and spot size from measurements. The modulation depth (MD) of moire and the electron beam spot are measured by a CCD camera. By varying the horizontal Dynamic Astigmatism and Focus (DAF) voltage, the variations of moire MD with beam spot are acquired. It is found that the spot size at both 5% and 50% of luminance distribution can characterize the moire MD in agreement with theoretical calculation
  • Keywords
    brightness; cathode-ray tube displays; moire fringes; shape measurement; size measurement; visibility; CCD camera; CRT display; DAF voltage variation; cathode ray tube display; display readability; electron beam spot; horizontal dynamic astigmatism/focus voltage; luminance distribution; mask aperture; modulation depth measurement; moire pattern; moire wavelength; scan moire visibility; spot size; Apertures; Cathode ray tubes; Charge coupled devices; Charge-coupled image sensors; Electron beams; Optical modulation; Size measurement; Vision defects; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Display, 1999. ASID '99. Proceedings of the 5th Asian Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    957-97347-9-8
  • Type

    conf

  • DOI
    10.1109/ASID.1999.762759
  • Filename
    762759