DocumentCode

2779594

Title

Divide And Merge Image Processing For Pattern Defect Analysis Of Printed Circuit Boards

Author

Ito, Masayasu ; Nikaido, Yosuhiro ; Hoshino, Michinori

Author_Institution

Tokyo University of Agriculture and Technology

fYear

1992

fDate

28-30 Sep 1992

Firstpage

178

Lastpage

182

Keywords

Circuit analysis; Conductors; Image analysis; Image processing; Inspection; Insulation; Optical sensors; Pattern analysis; Printed circuits; Skeleton;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International

Print_ISBN

0-7803-0755-0

Type

conf

DOI

10.1109/IEMT.1992.639886

Filename

639886