DocumentCode
2779615
Title
High-speed and high-density chip-to-chip interconnections: trends and techniques
Author
Schmatz, Martin L.
Author_Institution
IBM Zurich Res. Lab., Ruschlikon, Switzerland
fYear
2000
fDate
2000
Firstpage
23
Lastpage
24
Abstract
Modern CMOS processes are reaching and breaking the 0.1 μm gate length barrier, allowing many tens of millions of digital gates to operate at GHz clock frequencies. This allows the processing of an enormous amount of data every second. It is a major challenge to feed that data volume on and off the chip. Advanced Internet and symmetric multiprocessor (SMP) switch systems are already approaching the 1 Tbit/s aggregate data bandwidth requirement, with a clear trend towards single-chip implementation. This dictates that the input-output (I/O) circuits pump at a rate of 1 Tbit per second into one square inch of silicon and allow the processed Tbit to leave that same chip every second. However, the number of I/O circuits that may be used to address that issue is very limited because of the limited numbers of signal pins that a reasonable package provides. Even with 500 signal I/O pairs of a 2000 pin package, each pair has to transport 4 Gbit/s of user data over a typical backplane distance of 1 m, crossing two dense connectors. This presentation gives an overview of the trends and techniques to address the 1 Tbit/s I/O problem. Four main topics and their implications on packages are addressed: data encoding and modulation, clock and data recovery channel modeling, and channel equalization
Keywords
CMOS integrated circuits; electric connectors; encoding; equalisers; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; multiprocessor interconnection networks; synchronisation; 0.1 micron; 1 Tbit/s; 1 m; 4 Gbit/s; CMOS processes; I/O circuit pump rate; I/O circuits; Internet switch systems; aggregate data bandwidth requirement; backplane distance; channel equalization; clock frequencies; clock recovery channel modeling; data encoding; data modulation; data processing; data recovery channel modeling; data volume; dense connectors; digital gates; gate length; high-density chip-to-chip interconnections; high-speed chip-to-chip interconnections; input-output circuit pump rate; package signal pins; packages; signal I/O pairs; single-chip implementation; symmetric multiprocessor switch systems; user data; Aggregates; Bandwidth; CMOS process; Clocks; Feeds; Frequency; Integrated circuit interconnections; Internet; Packaging; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2000, IEEE Conference on.
Conference_Location
Scottsdale, AZ
Print_ISBN
0-7803-6450-3
Type
conf
DOI
10.1109/EPEP.2000.895484
Filename
895484
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