• DocumentCode
    2779772
  • Title

    Measurement of the trapping and detrapping properties of polymers in relation with their microstructure

  • Author

    Vallayer, B. ; Hourquebie, P. ; Marsacq, D.

  • Author_Institution
    CEA, Monts
  • Volume
    2
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    674
  • Abstract
    In the field of space charge physics, the role of electrical traps on space charge behaviour and therefore on the breakdown properties is well-established. However, the traps in polymers are very difficult to define compared to the case of ceramics for which a lot of studies have been performed. A new specific method for measuring the trapping and detrapping properties of dielectric materials has been developed. This method allows characterization of the electrostatic state of an insulating sample after irradiation by a high energy electron beam. We discuss the basis of the method and its general possibilities to measure breakdown relevant parameters such as the secondary electron yield for instance. Moreover, the method has been used on several polymers such as HDPE and LDPE. The difference of trapping properties between those materials can be explained by microstructure evolutions (crystallinity ratio) due to a difference of the branching rate. This difference of trapping and detrapping properties of these two polymers could be connected to the breakdown behaviour of the two materials which is known to be very different
  • Keywords
    crystal microstructure; electric breakdown; electron beam effects; electrostatics; polyethylene insulation; space charge; HDPE; LDPE; branching rate; breakdown properties; crystallinity ratio; detrapping measurement; dielectric materials; electrical traps; electrostatic state; high density polyethylene; high energy electron beam irradiation; insulating sample; low density polyethylene; microstructure; mirror method; polymers; secondary electron yield; space charge physics; trapping measurement; Ceramics; Crystalline materials; Dielectric materials; Dielectric measurements; Electric breakdown; Electron traps; Electrostatic measurements; Physics; Polymers; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549435
  • Filename
    549435