Title :
Measurement of electromagnetic interference in high frequency switching integrated circuits
Author :
Harnaes, H. ; Ndagijimana, F.
Author_Institution :
CNRS, Grenoble, France
Abstract :
In this paper, we present a high frequency test set-up for the characterisation of conducted electromagnetic interference (EMI) in high speed logic circuits. A line impedance stabilising network (LISN) operating up to 1 GHz has been designed and characterised. Then, a set-up for EMI measurement was developed and was applied to an RF SPDT switch
Keywords :
MMIC; UHF integrated circuits; circuit stability; electromagnetic interference; integrated circuit interconnections; integrated circuit measurement; integrated circuit packaging; integrated logic circuits; logic testing; 1 GHz; EMI; EMI measurement; EMI measurement set-up; LISN; LISN characterisation; LISN design; RF SPDT switch; conducted electromagnetic interference; electromagnetic interference; high frequency switching integrated circuits; high frequency test set-up; high speed logic circuits; line impedance stabilising network; operating frequency; Circuit testing; Coupling circuits; Electromagnetic interference; Electromagnetic measurements; Frequency measurement; Impedance; Integrated circuit measurements; Power measurement; Switches; Switching circuits;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2000, IEEE Conference on.
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-7803-6450-3
DOI :
10.1109/EPEP.2000.895507
