• DocumentCode
    2780203
  • Title

    EST: the new frontier in automatic test-pattern generation

  • Author

    Giraldi, John ; Bushnell, Michael L.

  • Author_Institution
    Rutgers Univ., Piscataway, NJ, USA
  • fYear
    1990
  • fDate
    24-28 Jun 1990
  • Firstpage
    667
  • Lastpage
    672
  • Abstract
    An algorithm, called EST, is presented which is a new combinatorial automatic test-pattern generation (ATPG) branch-and-bound search algorithm, based on the generation of equivalent logic decompositions (search states) at each search decision point. The E-frontier is an efficient representation of a search state and is used with a hashing algorithm to detect equivalent search states. When EST matches an equivalent search state from a prior fault, and both prior and current faults are sensitized, EST completes the current fault test-pattern with values from the prior fault test-pattern and terminates search immediately. A new method of redundant fault analysis is also introduced that uniquely determines signal values for subsequent test-pattern search. Results show that this algorithm accelerates the base ATPG algorithm by a factor of 1.03 to 328 when considering all faults, a factor of 1347:1 for hard-to-test faults and a factor of 200000 for certain redundancy proofs for the test cases shown
  • Keywords
    automatic testing; combinatorial circuits; integrated circuit testing; logic testing; redundancy; search problems; E-frontier; branch-and-bound search algorithm; combinatorial automatic test-pattern generation; equivalent logic decompositions; equivalent search states; hard-to-test faults; hashing algorithm; prior fault; redundant fault analysis; search decision point; signal values; test-pattern search; Acceleration; Automatic test pattern generation; Automatic testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Data structures; Fault detection; Life estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-363-9
  • Type

    conf

  • DOI
    10.1109/DAC.1990.114937
  • Filename
    114937