DocumentCode :
2780203
Title :
EST: the new frontier in automatic test-pattern generation
Author :
Giraldi, John ; Bushnell, Michael L.
Author_Institution :
Rutgers Univ., Piscataway, NJ, USA
fYear :
1990
fDate :
24-28 Jun 1990
Firstpage :
667
Lastpage :
672
Abstract :
An algorithm, called EST, is presented which is a new combinatorial automatic test-pattern generation (ATPG) branch-and-bound search algorithm, based on the generation of equivalent logic decompositions (search states) at each search decision point. The E-frontier is an efficient representation of a search state and is used with a hashing algorithm to detect equivalent search states. When EST matches an equivalent search state from a prior fault, and both prior and current faults are sensitized, EST completes the current fault test-pattern with values from the prior fault test-pattern and terminates search immediately. A new method of redundant fault analysis is also introduced that uniquely determines signal values for subsequent test-pattern search. Results show that this algorithm accelerates the base ATPG algorithm by a factor of 1.03 to 328 when considering all faults, a factor of 1347:1 for hard-to-test faults and a factor of 200000 for certain redundancy proofs for the test cases shown
Keywords :
automatic testing; combinatorial circuits; integrated circuit testing; logic testing; redundancy; search problems; E-frontier; branch-and-bound search algorithm; combinatorial automatic test-pattern generation; equivalent logic decompositions; equivalent search states; hard-to-test faults; hashing algorithm; prior fault; redundant fault analysis; search decision point; signal values; test-pattern search; Acceleration; Automatic test pattern generation; Automatic testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Data structures; Fault detection; Life estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location :
Orlando, FL
ISSN :
0738-100X
Print_ISBN :
0-89791-363-9
Type :
conf
DOI :
10.1109/DAC.1990.114937
Filename :
114937
Link To Document :
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