DocumentCode
2780307
Title
A Puncturing Scheme for Low-Density Parity-Check Codes Based on 1-SR Nodes
Author
Zhang, Lijun ; Ma, Fuli ; Cheng, L.L.
Author_Institution
Sch. of Electr. & Inform. Eng., Beijing Jiaotong Univ., Beijing, China
fYear
2012
fDate
3-6 Sept. 2012
Firstpage
1
Lastpage
6
Abstract
A rate-compatible puncturing scheme for LDPC codes is proposed based on the fact that a one-step recoverable (1-SR) node is more reliable than a k-SR node (k>;1) and a 1-SR node with more survived check nodes can be recovered more reliably in a recovery tree, so the scheme tries to obtain 1-SR nodes which have multiple survived check nodes as many as possible. Simulation results show that the puncturing scheme has better performance than both the random puncturing scheme and the novel method in [5].
Keywords
parity check codes; random processes; telecommunication network reliability; trees (mathematics); 1-SR nodes; LDPC codes; k-SR node; low-density parity-check codes; multiple survived check nodes; one-step recoverable (node; random puncturing scheme; rate-compatible puncturing scheme; recovery tree; Algorithm design and analysis; Bit error rate; Electronic mail; Encoding; Indexes; Parity check codes; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference (VTC Fall), 2012 IEEE
Conference_Location
Quebec City, QC
ISSN
1090-3038
Print_ISBN
978-1-4673-1880-8
Electronic_ISBN
1090-3038
Type
conf
DOI
10.1109/VTCFall.2012.6398903
Filename
6398903
Link To Document