DocumentCode
2780315
Title
Time resolved measurements of electroluminescence in XLPE under impulse voltage conditions
Author
Kaufhold, M. ; Bamji, S.S. ; Bulinski, A.T.
Author_Institution
Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume
2
fYear
1996
fDate
16-19 Jun 1996
Firstpage
686
Abstract
Time resolved electroluminescence (EL) measurements were performed on high voltage grade XLPE cable insulation using negative impulse voltages of different shape and duration. To create divergent fields in the insulation, needle electrodes made of semiconductive polymer were used. It is shown that the EL emission probability is independent of the impulse rise time but increases with the impulse fall time and amplitude. Independently of the impulse shape and duration, EL pulses are always grouped into two distinct time intervals between which there is no EL activity. The first EL period begins at the rising portion of the impulse and the second at the falling portion when the impulse voltage drops below 50% of its peak value. EL emission during the first interval is believed to be caused by electron injection and the impact excitation processes, whereas the EL in the second interval is seen to be due to the local electric field reversal and the electron-hole recombination
Keywords
XLPE insulation; electric breakdown; electroluminescence; electron-hole recombination; impulse testing; insulation testing; power cable insulation; power cable testing; XLPE power cable insulation; divergent fields; electron injection; electron-hole recombination; impact excitation processes; impulse fall time; impulse rise time; insulation breakdown tests; local electric field reversal; needle electrodes; negative impulse voltages; time resolved electroluminescence measurements; voltage duration; voltage shape; Cable insulation; Electrodes; Electroluminescence; Needles; Performance evaluation; Plastic insulation; Polymers; Shape measurement; Time measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location
Montreal, Que.
ISSN
1089-084X
Print_ISBN
0-7803-3531-7
Type
conf
DOI
10.1109/ELINSL.1996.549438
Filename
549438
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