Title :
Laser-based Noncontact In SZTU Overdrive Of Electronic Modules
Author :
Umstadter, Karl R. ; Millard, Don L. ; Block, Robert C.
Author_Institution :
Rensselaer Polytechnic Institute
Keywords :
Circuit testing; Costs; Distortion measurement; Electrodes; Hardware; Plasma measurements; Printed circuits; Signal analysis; System testing; Wiring;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
DOI :
10.1109/IEMT.1992.639891
