Title :
Systematic development of transmission line models for interconnects with frequency-dependent losses
Author :
Coperich, K. ; Morsey, J. ; Okhmatovski, V. ; Cangellaris, A.C. ; Ruehli, A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
This paper presents a systematic methodology for the development of transmission line models for interconnects with frequency-dependent per-unit-length parameters. The proposed methodology is such that a variety of models can be developed for use either in frequency-domain or time-domain simulation of signal propagation in the interconnects. The models derived make no assumption about the frequency dependence of the elements (both diagonal and off-diagonal) of the per-unit-length inductance and resistance matrices. Furthermore, their form is such that model order reduction can be effected using a variety of state-of-the-art methodologies
Keywords :
circuit simulation; electric resistance; frequency-domain analysis; inductance; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; matrix algebra; time-domain analysis; transmission line theory; diagonal elements; frequency dependence; frequency-dependent losses; frequency-dependent per-unit-length parameters; frequency-domain simulation; interconnects; model order reduction; models; off-diagonal elements; per-unit-length inductance matrices; per-unit-length resistance matrices; signal propagation; time-domain simulation; transmission line models; Conductors; Fitting; Frequency; Impedance; Inductance; Multiconductor transmission lines; Propagation losses; Time domain analysis; Transmission line matrix methods; Transmission lines;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2000, IEEE Conference on.
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-7803-6450-3
DOI :
10.1109/EPEP.2000.895532