• DocumentCode
    2780519
  • Title

    Global Test Site Network paves the way to the optimal site-related photovoltaic solution

  • Author

    Wittner, Michael ; Weber, Timo ; Richardson, William ; Striner, Ben ; Baggio, Nicola

  • Author_Institution
    SOLON SE, Berlin, Germany
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    This paper discusses three identical test-sites, built with the same components, in different locations of the world. SOLON installed three cloned systems, all of which are composed of one SOLON Mover-XL Dual-Axis Tracker, one SOLON Single Axis Tracker, one fixed rack tilted at latitude, and one fixed rack at 0°. Each field is divided into 24 sub-units of 1.5 kWp peak power in order to compare different types of modules with a reasonable power and thus minimize the measurement uncertainties. The systems are installed in three distinctly different locations: Tucson, Berlin (Adlershof), and Northern Italy, to allow SOLON to study the effects of these climatic regions on module and system performance. The architecture of the Test Site Network allows not only the comparison of various types of modules on the same site, but also the same modules in a wide range of climatic conditions. Moreover, thanks to this approach, inverter efficiency tests can be conducted. Spectral distributions, temperatures and different environmental conditions all influence the behavior of the module and the performance parameters of the system. In this sense, the present work is the beginning of a process that will identify the optimal site-related photovoltaic solution to maximize the energy output in each region and ultimately reduce the LCOE.
  • Keywords
    measurement uncertainty; solar cells; Adlershof; Berlin; Northern Italy; SOLON Mover-XL Dual-Axis Tracker; SOLON Single Axis Tracker; Tucson; fixed rack; global test site network; inverter efficiency tests; optimal site-related photovoltaic solution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616844
  • Filename
    5616844