• DocumentCode
    2780566
  • Title

    Design of two-dimensional waveguide slot arrays using the combination of a full-wave moment method analysis and an equivalent circuit model

  • Author

    Zhang, Miao ; Hirokawa, Jiro ; Ando, Makoto

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A novel design technique with the combination of a full-wave MoM analysis and an equivalent circuit model is proposed for the design of waveguide slot arrays with desired aperture distribution as well as input matching. The admittance in the circuit and spacing are determined to realize desired distribution of power and phase as well as input matching. The full-wave MoM analysis, evaluating all the mutual coupling with high-efficiency and high-accuracy is applied for the design of slot parameters realize the desired value of circuit element specified above. The difference of aperture distribution of power on slot aperture and radiating field observed in main beam direction is also investigated. By following the design procedure, two waveguide slot arrays of 27-by-24 elements are successfully designed for the uniform and Taylor distributions. The uniformity with variations in amplitude and phase below 1dB and 5degrees for each, and a very low side lobe level below -35dB are obtained.
  • Keywords
    antenna radiation patterns; aperture antennas; equivalent circuits; method of moments; slot antenna arrays; waveguide antenna arrays; MoM analysis; aperture distribution; equivalent circuit model; full-wave moment method analysis; input matching; radiating field; slot parameters; two-dimensional waveguide slot arrays; Admittance; Antenna arrays; Apertures; Equivalent circuits; Impedance matching; Millimeter wave technology; Moment methods; Mutual coupling; Optical reflection; Radar antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4620057
  • Filename
    4620057