Title :
Noise-resistant Signal Processing For Electronically Scanned White-Light Interferometry
Author :
Dändliker, R. ; Zimmermann, E. ; Frosio, G.
Author_Institution :
University of Neuchatel, Switzerland
Keywords :
Computer simulation; Equations; Gravity; Interferometry; Limiting; Sampling methods; Shape; Signal processing; Testing; Tin;
Conference_Titel :
Optical Fiber Sensors Conference, 1992. 8th
Print_ISBN :
0-7803-0518-3
DOI :
10.1109/OFS.1992.762959
